Published on Friday February 16, 2007
Dr. Zhorro Nikolov, Director of the Drexel Materials Characterization Facility, has been invited to present his paper titled, “Analysis of Interfacial Water Structure close to Mixed Langmuir Monolayers by Sum-Frequency Spectroscopy,” (Z.S. Nikolov, D.W. Britt, and J.D. Miller) at the 2007 NSTI Nanotechnology Conference and Trade Show to be held on May 20 through 24 in Santa Clara, CA. Dr. Nikolov’s talk will take place at 5:20 p.m. on Monday, May 21, as part of the Nanoscale Characterization, Spectroscopy and Electrical: Electronics and Bonding, segment of the conference.
NSTI Meetings and Workshops draw attendees from around the globe. This year marks the 10th Annual NSTI Nanotech Conference and Trade Show, the largest international nanotechnology conference in the world with more than 4,000 participants and more than 400 exhibitors.